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5E-XRF2501(*Integrated) EDXRF Spectrometer^NEW!

XRF2501(*Integrated) EDXRF Spectrometer adopts energy dispersive X-ray fluorescence spectrum, which is a qualitative and quantitative analysis technique for rapid and nondestructive determination of major and minor elements in various types of samples (solid, powder, liquid).

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Features
Specifications
Spare parts
Case

Every second counts for process and quality control. Test results are urgently needed from the moment the sample is received. XRF2501(*Integrated) is equipped with a simple and intuitive interface that allows you to load samples, touch the button, and get high-quality results in seconds.

Compared with AAS,AFS,ICP and ICP-MS analysis technology, there is no need for XRF2501(*Integrated) to dissolve and digest samples, or use chemical reagent. The analysis speed of it is rapid without destroying samples. XRF2501(*Integrated) can be used to analyze samples, whether solid or liquid, pressed or powder, large or small.

Wide Applicability: Suitable for solid, liquid, powder and particle samples.

Easy Operation:
There is no need for complicated sample preprocessing. Users only need to put samples into the test area and click Start to complete the analysis.

High Efficiency:
1-15min for single sample analysis (which can be adjusted as required).

Modular Design:
Built-in vacuum pump and external branded PC with 23-inch HD screen.
Free combination as needed fits a variety of usage scenarios.

Low Cost:
No chemical and other consumables are needed, and no helium is consumed in vacuum mode.

Best Resolution and CR:
Adopt new generation VITUS silicon drift detector from Germany with the best count rate and energy resolution. Make full use of the output of 50W power optical tube, ensuring XRF2501(*Integrated) has high stability and sensitivity.

Wide Range:
All elements from Na-U are tested at concentrations ranging from PPM to 100%.

Safe Operation:
The test chamber of the instrument adopts triple protection measures including thick copper, electronic interlock design and software interrupt, absolutely ensuring no X-ray leakage in any test environment.

Model	*XRF2501(Integrated) EDXRF Spectrometer**
Elements	All elements from Na-U
Concentration Range	ppm-100%
Application Scope	Phosphorus in coal and coal ash composition analysis (Na₂O, MgO, Al₂O₃, SiO₂, P₂O₅,SO₃, K₂O, CaO,Fe₂O₃, etc.);Cement, RoHS, geological mining, plastic polymer, petrochemical, metal, environmental protection, medicine, archaeological art, food and cosmetics.
Sample types	Powder, Particle, Solution, Sol, Solid, etc.
Sample Rotation	Increase the test area by rotating the sample to improve the repeatability and accuracy
X-Ray Tube	Optional target materials Max Power: 50W Max Voltage: 50KV Max Current:1mA
Detectors	Silicon Drift Detector Energy Resolution: 127eV FWHM @ Mn Kα Count Rate: 1000000cps Peltier Cooling
He Scour System	The built-in helium scour system improves the testing performance of powder samples.
Pollution Protection System	Integrated detector and x-ray tube protection system to avoid liquid sample leakage, solid sample falling particles and damage to detector and x-ray tube by dust.
Vacuum System	Tablet sample is measured in vacuum mode and does not consume any helium.
Radiation Safety	Conform to GBZ115—2002 Radiological protection standards for X-ray diffraction and fluorescence analysis equipment
Dimensions(L×W×H)	680×550×400mm

5E-XRF2501(*Integrated) EDXRF SpectrometerNEW!

5E-XRF2501(*Integrated) EDXRF Spectrometer^NEW!